Long Distance Microscope can be used for microscopic failure analysis from distances of 15cm to 40 cm and for observation of micro change as 1μmm. Analysis of failure characteristics can be processed along with CCD image acquisition systems. Long Distance Microscope is different from the traditional microscope and can precede dynamic observations beyond the normal static observations.

Microscope can move near the tested objects, and cared with protection it can observe the micro change of objects subjected to environments of high temperature, high humidity, and corrosive gas. Real time observation for thermal expansion, crack propagation, and fatigue of metal under high temperature loadings are some application examples.

Monitoring the growth rate of crystal is necessary during its growth period. No objects are allowed to close to its surface when subjected to high temperature and vacuum environment. Normally we can only monitor its growth rate and growth process indirectly. With long distance microscope we can then directly observe it.